Multi-Class SVMs for Automatic Detection and Diagnosis in Process Control Loops
PDF

Supplementary Files

Declaration
Multi-Class SVMs for Automatic Detection and Diagnosis in Process Control Loops

Keywords

controller performance assessment
support vector machines
autocorrelation function
feature extraction
PI controllers.

Abstract

The aim of this paper is to present a novel framework using Multi-Class Support Vector Machines (MC-SVMs) to classify the performance of closed loop single-input-single-output feedback controllers. A SVM is trained to recognize descriptive statistical patterns originating from an Autocorrelation Function (ACF) of process data vectors. ACF patterns emanating from different closed loop behaviors are used in the feature extraction procedure. Simulation study and application to real world industrial data sets show that the MC-SVM classification tool is capable of detecting and diagnosing problematic control loops with very good accuracy and efficiency.
PDF